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Synchrotron x-ray diffraction studies were performed on a synthetic layered silicate Fluorohectorite clay. Diffraction patterns along the stacking direction were obtained in surface reflection and bulk transmission geometries on bulk pressed samples under controlled temperature and relative humidity. One-dimensional structure factors modeling the positions of the intercalant atoms have been obtained for three stable hydration states. From the narrow (00l) peak widths we conclude thatdoi:10.1103/physreve.66.011303 pmid:12241350 fatcat:bn67wuejz5gfxjmqjofaispise