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An iterative flow to generate test sets providing high fault coverage under extreme parameter variations is presented. The generation is guided by the novel metric of circuit coverage, calculated by massively parallel statistical fault simulation on GPGPUs. Experiments show that the statistical fault coverage of the generated test sets exceeds by far that achieved by standard approaches.doi:10.1109/ats.2012.14 dblp:conf/ats/CzutroIJMSBPW12 fatcat:tl3q36vilvddvjsaqolourvkcu