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Accurately quantifying thin-layer parameters by applying a targeted reflection waveform inversion methodology to ground-penetrating radar (GPR) reflection data may provide a useful tool for near-surface investigation and especially for contaminated site investigation where nonaqueous phase liquid (NAPL) contaminants are present. We implemented a targeted reflection waveform inversion algorithm to quantify thin-layer permittivity, thickness, and conductivity for NAPL thin (≤ 1∕2 dominantdoi:10.1190/geo2014-0037.1 fatcat:x7mo3xpgofdg5gdxj3ipve35im