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Atomically resolved images on a MgO(001) thin film deposited on Ag(001) obtained in ultrahigh vacuum by frequency modulated atomic force microscopy at low temperature are presented and analysed. Images obtained in the attractive regime show a different type of contrast formation from those acquired in the repulsive regime. For the interpretation of the image contrast we have investigated the tip-sample interaction. Force and energy were recovered from frequency shift versus distance curves. Thedoi:10.1088/0957-4484/17/7/s01 pmid:21727400 fatcat:e3fwlemdj5fc5d4zeczeoykb5e