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Radiation Damage by Ar+ Ion-Milling in Ferroelectric Oxides
2005
Microscopy and Microanalysis
Ferroelectric oxides have a variety of applications as infrared sensors, actuators and non-volatile memory devices. A subgroup of these oxides fall into the category of complex perovskite relaxors, in which there is dispersion in the dielectric constant versus temperature as a function of frequency [1] . The relaxor oxides subjected to significant studies include Pb 2 (Sc,Ta)O 6 , Pb(Mg 1/3 ,Nb 2/3 )O 3 , Pb(Sc 0.5 ,Nb 0.5 )O 3 and Pb(Zr,Ti)O 3 [2-3]. The ceramics, films and crystals of these
doi:10.1017/s1431927605505154
fatcat:zc2ewszgafbv7a5vwlyygncnem