Radiation Damage by Ar+ Ion-Milling in Ferroelectric Oxides

K Z Baba-Kishi, C W Tai
2005 Microscopy and Microanalysis  
Ferroelectric oxides have a variety of applications as infrared sensors, actuators and non-volatile memory devices. A subgroup of these oxides fall into the category of complex perovskite relaxors, in which there is dispersion in the dielectric constant versus temperature as a function of frequency [1] . The relaxor oxides subjected to significant studies include Pb 2 (Sc,Ta)O 6 , Pb(Mg 1/3 ,Nb 2/3 )O 3 , Pb(Sc 0.5 ,Nb 0.5 )O 3 and Pb(Zr,Ti)O 3 [2-3]. The ceramics, films and crystals of these
more » ... terials have interesting structural, microstructural, and domain characteristics that can be studied by transmission electron microscopy, TEM. In most cases where TEM study is required, Ar + ion-milling of the samples must be carried out.
doi:10.1017/s1431927605505154 fatcat:zc2ewszgafbv7a5vwlyygncnem