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Quantitative study of AFM-based nanopatterning of graphene nanoplate
2014
14th IEEE International Conference on Nanotechnology
In this presentation, a quantitative study of the patterning of graphene nanoplates using Atomic force microscopy (AFM) based nanolithography was performed. Nanoscale trenches with controllable width and depth are created on graphene nanoplates by employing force-controlled nanomechanical cutting and voltage-controlled local anodic oxidation (LAO) technique, respectively. During cutting process, the effect of the applied cutting force and LAO voltage on trench dimension is quantitatively
doi:10.1109/nano.2014.6968106
fatcat:2c2zpplvxfc25br2cnjcx7ntda