Characterization of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements
Journal of Physics, Conference Series
Thin films of nano-composite Y-Ba-Cu-O (YBCO) superconductors containing nano-sized, non-superconducting particles of Y 2 Ba 4 CuMO x (M-2411 with M = Ag and Nb) have been prepared by the PLD technique. Electron backscatter diffraction (EBSD) has been used to analyze the crystallographic orientation of nano-particles embedded in the film microstructure. The superconducting YBa 2 Cu 3 O 7 (Y-123) phase matrix is textured with a dominant (001) orientation for all samples, whereas the M-2411 phase
... as the M-2411 phase exhibits a random orientation. Angular critical current measurements at various temperature (T) and applied magnetic field (B) have been performed on thin films containing different concentration of the M-2411 second phase. An increase in critical current density J c at T < 77 K and B < 6 T is observed for samples with low concentration of the second phase (2 mol % M-2411). Films containing 5 mol % Ag-2411 exhibit lower J c than pure Y-123 thin films at all fields and temperatures. Samples with 5 mol % Nb-2411 show higher J c (B) than phase pure Y-123 thin films for T < 77 K.