A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2021; you can also visit the original URL.
The file type is application/pdf
.
In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes
2021
Sensors
Long slender piezoresistive silicon microprobes are a new type of sensor for measurement of surface roughness. Their advantage is the ability to measure at speeds of up to 15 mm/s, which is much faster than conventional stylus probes. The drawbacks are their small measurement range and tendency to break easily when deflected by more than the allowed range of 1 mm. In this article, previously developed microprobes were tested in the laboratory to evaluate their metrological properties, then
doi:10.3390/s21175955
pmid:34502846
fatcat:56qd2p7o4ncf3owpl2uernlgeu