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Model Analysis of Scanning Viscoelasticity Microscopy and Its Applications to Polymer Surfaces
走査粘弾性顕微鏡の力学モデル化と高分子表面への応用
2008
Nihon Reoroji Gakkaishi
走査粘弾性顕微鏡の力学モデル化と高分子表面への応用
Scanning viscoelasticity microscopy (SVM) with a mechanical model analysis was applied to polystyrene (PS) surfaces. When the surface was in a glassy state, that is, in an elastic regime, the SVM vibrational system can be simply expressed by a series model composed of two springs such as a cantilever and the sample surface. Once the surface reaches in a viscoelastic regime, a damping factor must be incorporated into the model surface. The spring constants for the PS surfaces being in glassy and
doi:10.1678/rheology.36.87
fatcat:emqeuyb5tbf7ffra4peamzc2ye