Metrology and methodology of system level ESD testing

D. Lin, D. Pommerenke, J. Barth, L.G. Henry, H. Hyatt, M. Hopkins, G. Senko, D. Smith
Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347)  
Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.
doi:10.1109/eosesd.1998.737019 fatcat:zefcxtj4qrbvfk3xltionfhxia