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Tip motion in amplitude modulation (tapping-mode) atomic-force microscopy: Comparison between continuous and point-mass models
2002
Applied Physics Letters
We discuss the influence of high-order frequency components in the operation of an amplitude modulation atomic-force microscope ͑AFM͒. A comparative study of point-mass and continuous models is performed to describe the tip motion. The tip-surface interaction force excites high-order frequency components whenever a higher harmonic of the excitation force is close to an eigenmode of the cantilever beam. The strength of those components depends on the set point amplitude and the fundamental
doi:10.1063/1.1456543
fatcat:mftnbiqr4rdytkp2ejx4dkyy4e