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Fabrication of nanopores utilizing SiC/Si(001) heteroepitaxial growth on SOI substrates: nanopore density control
2010
Seventh International Conference on Thin Film Physics and Applications
We have investigated the nanopore formation utilizing SiC/Si (001) heteroepitaxial growth. Inverse pyramidal pits were produced by {111} faceted on the top of Si layer of Silicon on Insulator (001) substrate after SiC growth by using CH 3 SiH 3 pulse jet chemical vapor deposition. Randomly distributed nanopores with the size of 10 nm were obtained after dipped into BHF solution for etching the buried oxide layer through the top of the pit. It was found that the densities of the pits and the
doi:10.1117/12.888388
fatcat:cm62bbbs2fhj5m2scy5z3nxiq4