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CRYSTALLIZATION OF COMPOSITIONALLY MODULATED AMORPHOUS Ni-P LAYERS
1988
Le Journal de Physique Colloques
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Electrodeposition technique was utilized to prepare amorphous Ni-P composition modulated layers (CML). High temperature magnetization measurements were applied to trace the crystallization process. For amorphous CML composed of alternating Ni78P22/NiS8P12 sublayers of the thicknesses of 7 nm, a two step crystallization was obse~ed, which is interpreted as two independent transformations in each sublayers.
doi:10.1051/jphyscol:19888587
fatcat:ejnhy6admbfrzpefm42q5tgiye