Quantification Curves for Mica/Smectite Interstratifications by X-ray Powder Diffraction

Katsutoshi Tomita
1988 Clays and clay minerals  
X-ray powder diffraction (XRD) patterns for many interstratified mica/glycolated smectites were calculated by changing combinations of probabilities and transition probabilities of two-component layers. Three basal XRD reflections, 5.1L7.6~ (P l), 8.9 ~ 0.2~ (P2), and 16.1~176 (P3) were selected for the quantification curves. A distinct relationship exists between a20~ (p2 -Pl) and A202 (P3 --P2) which shows systematic changes with expandability at constant Reichweite values. The calculated
more » ... es were plotted with A20~ and A20: as the axes of coordinates, and quantification curves were calculated. The components and stacking parameters of mica/smectites were estimated easily using this diagram. Probabilities of existence of component layers and their transition probabilities for Reichweite (R=0) and (R= 1) structures, and special cases of R=2 and R=3 structures were obtained.
doi:10.1346/ccmn.1988.0360307 fatcat:uaqser2awvhifpunch7i534ffu