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Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs From MCUs
IEEE Transactions on Nuclear Science
Recently, the occurrence of multiple events in static tests has been investigated by checking the statistical distribution of the difference between the addresses of the words containing bitflips. That method has been successfully applied to Field Programmable Gate Arrays (FPGAs) and the original authors indicate that it is also valid for SRAMs. This paper presents a modified methodology that is based on checking the XORed addresses with bitflips, rather than on the difference. Irradiationdoi:10.1109/tns.2016.2551263 fatcat:qdnedn2eu5eshlsvq2wt2grj2m