Determination of material properties by use of third-harmonic generation microscopy

J. M. Schins, T. Schrama, J. Squier, G. J. Brakenhoff, M. Müller
2002 Journal of the Optical Society of America. B, Optical physics  
Determination of material properties by use of third-harmonic generation microscopy. Schins, J.M.; Schrama, Th.; Squier, J.; Brakenhoff, G.J.; Müller, M. The fundamental features of third-harmonic generation microscopy are examined both theoretically and experimentally, and the technique is applied to the characterization of layered structures. Measurements and model calculations have been performed of the third-harmonic yield generated from homogeneous layers. Model calculations based on the
more » ... ions based on the paraxial approximation show good agreement with the experimental results, despite the conditions of high numerical aperture. The method proposed here allows for the determination of (i) the layer's third-order susceptibility relative to that of the substrate, (ii) its index of refraction at the thirdharmonic frequency relative to that at the fundamental frequency, and (iii) its thickness and for the identification of a gradient region between two adjacent layers.
doi:10.1364/josab.19.001627 fatcat:tyfeb57duvc3xhkofvf44aobbi