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IEEE design & test
Spectral test of high performance Analog-to-Digital Converters is very challenging due to several stringent requirements on the test setup. As a result, expensive instrumentation and long test time are needed. Several methods have been proposed to relax some of these requirements to decrease test time and cost. In this article, four such methods are described and compared based on several criteria pertinent to practical implementation in high performance spectral testing. A summary is presenteddoi:10.1109/mdat.2014.2348315 fatcat:66prtdhydnebpmbb6zgyme5fpm