Carafe: an inductive fault analysis tool for CMOS VLSI circuits

A. Jee, F.J. Ferguson
Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium  
Traditional fault models for testing CMOS VLSI circuits do not take into account the actual mechanisms that precipitate faults in CMOS circuits. As a result, tests based o n t r aditional fault models may not detect the actual faults in the circuit. This paper discusses the Carafe software p ackage which determines which faults are likely to occur in a circuit based o n the circuit's physical design, defect parameters, and fabrication technology.
doi:10.1109/vtest.1993.313302 dblp:conf/vts/JeeF93 fatcat:cusuoaetpvaxnjaoedprl5qnji