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Versatile atomic force microscopy setup combined with micro-focused X-ray beam
2015
Review of Scientific Instruments
Preserved Fulltext
Articles you may be interested in In situ observation of the elastic deformation of a single epitaxial SiGe crystal by combining atomic force microscopy and micro x-ray diffraction
doi:10.1063/1.4922605
pmid:26133870
fatcat:6wrzpizt3rcwzcbewp7n2jgk3m