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Journal of the Spectroscopical Society of Japan
X-ray fluorescence holography (XFH) provides three dimensional atomic images around specified elements. The XFH uses atoms as a wave source or monitor of interference field within a crystal sample, and therefore it can record both intensity and phase of scattered X-rays. Its current performance makes it possible to apply to ultra thin film, impurity and quasicrystal. In this article, I show the theory including solutions for twin image problem, advanced measuring system, data processing fordoi:10.5111/bunkou.57.124 fatcat:juv6jpyouzccfgzpfg4mqn556m