IC Chip Package Inspection with an Amplitude and Phase Scanning Acoustic Microscope [chapter]

C-H. Chou, B. T. Khuri-Yakub
1991 Review of Progress in Quantitative Nondestructive Evaluation  
doi:10.1007/978-1-4615-3742-7_6 fatcat:nkksq2t6e5b3hdmo2v4o2trcl4