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Semiconductor strain gauges were used to measure the internal strain along the axes of spherical and disk plaster specimens when subjected to lithotripter shock pulses. The pulses were produced by one of two lithotripters. The first source generates spherically diverging shock waves of peak pressure approximately 1 MPa at the surface of the specimen. For this source, the incident and first reflected pressure (P) waves in both sphere and disk specimens were identified. In addition, wavesdoi:10.1121/1.406882 pmid:8370871 fatcat:gufqsdtj3jagpnz4fjc4hd6q3u