The Influence of the Matrix Glass and Al2O3 Substrate on the Electrical Conduction Paths in the SnO2 Thick Film Resistor System

Haruhisa SHIOMI, Masahiko NAKAMURA, Yoshiaki MATSUMURA, Kenji FUJIMURA, Jyuji ISHIGAME, Kazuaki ONOUE
1992 Journal of the Ceramic Society of Japan  
doi:10.2109/jcersj.100.634 fatcat:v2zt44sjhndalb2d6wnlnigmve