Internet Archive Scholar

The Influence of the Matrix Glass and Al2O3 Substrate on the Electrical Conduction Paths in the SnO2 Thick Film Resistor System

Haruhisa SHIOMI, Masahiko NAKAMURA, Yoshiaki MATSUMURA, Kenji FUJIMURA, Jyuji ISHIGAME, Kazuaki ONOUE
1992 Journal of the Ceramic Society of Japan  

Preserved Fulltext

fulltext thumbnail
Web Archive Capture PDF (2.2 MB)
https://web.archive.org/web/20190506050229/https://www.jstage.jst.go.jp/article/jcersj1988/100/1161/100_1161_634/_pdf

A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2019; you can also visit the original URL. The file type is application/pdf.

doi:10.2109/jcersj.100.634 fatcat:v2zt44sjhndalb2d6wnlnigmve
Citation

Haruhisa SHIOMI, Masahiko NAKAMURA, Yoshiaki MATSUMURA, Kenji FUJIMURA, Jyuji ISHIGAME, Kazuaki ONOUE. "The Influence of the Matrix Glass and Al2O3 Substrate on the Electrical Conduction Paths in the SnO2 Thick Film Resistor System." Journal of the Ceramic Society of Japan 100.1161 (1992) 634-639