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As process variations grow with technology scaling, failure rates increase and are predicted to be so high as to render devices unusable for computing domain. In order to continue to benefit from scaling, three dimensions can be explored: increasing operational margins, testing, and the resilience of applications. The solutions in each dimension bring out different trade-offs in yield, failure rate, test cost, and performance. We use a ternary content-addressable memory (TCAM) as a case studydoi:10.1109/ats.2013.54 dblp:conf/ats/HsiungC0GG13 fatcat:p6panv4vzrgpfipwrq55sjxafy