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2008 IEEE International Symposium on Industrial Electronics
In this paper, we study and present two techniques to improve the performance of a simulation-based fault injection platform that inserts bit flips in order to model soft errors on digital circuits. The platform is based on the ESA Data Systems Division's SEE Simulation Tool. In contrast with methods based on emulation, the proposed approach reduces the complexity and costs, supplying a test environment with the same reliability as emulation systems. Only one disadvantage appears when comparingdoi:10.1109/isie.2008.4676995 fatcat:sptzrsfitjgjfggk7nzjyycb7i