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Characterization of Intercalated Smectites Using XRD Profile Analysis in the Low-Angle Region
Clays and clay minerals
X-ray diffraction (XRD) characterization of natural and intercalated smectites is usually limited to the apparent d-value estimated from the peak maxima in the raw data. This can lead to the misinterpretation of the measured data. In the case of XRD, the interference function is modulated by instrumental factors (Lorentz-polarization factor, diffraction geometry) and physical factors (structure factor, surface roughness effect). These effects lead to diffraction profile distortions, dependingdoi:10.1346/ccmn.1998.0460107 fatcat:dq7v5eiqx5ej3mqamvnpwjvl2m