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X-ray spectroscopy of multicharged xenon ions at the EBIT plasma
2015
Journal of Physics, Conference Series
Electron recombination with multicharged ions via chaotic many-electron states J C Berengut, V V Flambaum, V A Dzuba et al. - The EBIT Quest for Better Transition Synopsis X-ray spectra of multicharged xenon ions created in an electron-beam ion trap (EBIT) were measured both with a low-resolution silicon drift detector (SDD) and a high-resolution Johann/Johannson type crystal diffraction spectrometer. The measurement were performed in the electron-beam ion source (EBIS) using the transmission,
doi:10.1088/1742-6596/635/5/052092
fatcat:ybyo5hsn5zerxbwpd3znfq2xr4