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We have investigated Fe x Ti 1Ϫx O 2Ϫ␦ (xϭ0.02, 0.06, and 0.08͒ thin films grown on ␣-Al 2 O 3 substrates by pulsed-laser deposition. X-ray diffraction results indicate that the films are single phase and of reduced-rutile type. Detailed microstructural observations reveal no measurable magnetic impurities in the films. Vibrating sample magnetometer measurements show the films are ferromagnetic at room temperature with coercivity ranging from 340 to 770 Oe. The temperature dependence of thedoi:10.1063/1.1556122 fatcat:ewkcoonpinhb3geelrmkdwrcbe