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Post-silicon validation is an essential part of modern integrated circuit design to capture bugs and design errors that escape pre-silicon validation phase. A major problem governing post-silicon debug is the observability of internal signals since the chip has already been manufactured. Storage requirements limit the number of signals that can be traced; therefore, a major challenge is how to reconstruct the majority of the remaining signals based on traced values. Existing approaches focus ondoi:10.1109/vlsid.2011.14 dblp:conf/vlsid/BasuM11 fatcat:6ikf3djpw5gwrpnymiwbe5rizm