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The influence of aluminium on the electrical properties of silicon bicrystals was analyzed and related to the interaction between impurities and defects. A p-type silicon E 9 symmetrical tilt bicrystal, with a chemical gradient in aluminium was grown by a directional solidification method. The combination of electrical, chemical and structural local information, with high spatial resolution enabled the electrical activity to be correlated to the cristallochemistry of the boundary. It was showndoi:10.1051/jp4:1991636 fatcat:maebhbvcnrhavirtrwdcrrznli