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Covering SPL Behaviour with Sampled Configurations
2015
Proceedings of the Ninth International Workshop on Variability Modelling of Software-intensive Systems - VaMoS '15
Structural approaches to Software Product Lines (SPL) testing (such as pairwise testing) have gained momentum as they are able to scale to larger SPLs described as feature diagrams (FD). However, these methods are agnostic with respect to behaviour: the sampled configurations have thus no reason to satisfy any given behavioural criterion. In this paper, we investigate the behavioural coverage of two structural testing criteria: pairwise and similarity. To do so, we modelled four SPLs in terms
doi:10.1145/2701319.2701325
dblp:conf/vamos/DevroeyPLSH15
fatcat:ee4nusrfazdp7osbmkgb7spwdu