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With technology scaling, the deviation between predicted path delay using simulation and actual path delay on silicon increases due to process variation and aging. Hence, on-chip measurement architectures are now widely used due to their higher accuracy and lower cost compared to using external expensive measurement devices. In this paper, a novel path-delay measurement architecture called path-based ring oscillator (Path-RO) which takes into account variations is proposed. Path-RO can performdoi:10.1109/tvlsi.2011.2158124 fatcat:uyyspw5cxbbc5oqc2cwvz6uipm