Contrast Mechanism for Visualization of Ferroelectric Domains with Scanning Force Microscopy

T. Jungk, E. Soergel
2006 Ferroelectrics (Print)  
Scanning force microscopy is an ideal technique for non-destructive investigation of ferroelectric domains. Application of such domains for efficient optical frequency conversion and for ultrahigh-density data storage requires µm to nm-sized domain structures. Thus the high lateral resolution offered by scanning force microscopy is highly desired. However, the mechanism causing the domain contrast is not yet fully understood. Investigations of periodically-poled lithium niobate samples with
more » ... te samples with conductive as well as insulating surface layers indicate that the observed domain contrast is not solely due to the electromechanical piezoresponse.
doi:10.1080/00150190600689654 fatcat:so4yn5q6bzbaphyuqjgkv5zv6a