Memory Test Optimization for Parasitic Bit Line Coupling in SRAMs

Sandra Irobi, Zaid Al-Ars, Said Hamdioui
2011 2011 Sixteenth IEEE European Test Symposium  
doi:10.1109/ets.2011.11 dblp:conf/ets/IrobiAH11 fatcat:mykdwlmjk5cztea64p7a3env2i