An Ion Chamber Dedicated to Carbon NEXAFS: Removal of High-Order X-Rays and Reliable Flux Measurement

Liang-Jen Fan, Yaw-Wen Yang, Kaidee Lee
2007 AIP Conference Proceedings  
The difficulty of performing a reliable carbon NEXAFS measurement for thin films and adsorbate systems has long been recognized. The difficulty is typically related to lower S/B, carbon buildup in beamline optics, dirty mesh, presence of the high-order x-rays, etc. To alleviate the experimental difficulty, we have constructed an intensitymonitoring ion chamber situated between the beamline and sample chamber. The ion chamber is filled with argon up to a working pressure of 10 -3 Torr and
more » ... ted with 0.1 µm thick Ti foils at both ends. Titanium foils and the filled argon gas effectively remove the high-order x-rays. Consequently, the data are acquired with predominant 1 st -order xrays and thus free of the aforementioned interference, leading to a more reliable data analysis.
doi:10.1063/1.2644705 fatcat:vm27yypssnc4rgppcp7vp3y74u