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This article discusses the importance of analytical and experimental approaches in Deep level transient Fourier spectroscopy in terms of reliability, to support the current research and the utilization of this technique for complex investigations. An alternative evaluation approach is proposed and validated by relevant experiments. Attention is focused on a GaAs p-i-n structure, the undoped layer induced defect conduction type statement difficulty, accurate evaluation of a dual typedoi:10.2478/jee-2019-0038 fatcat:6pr3o2awyfdlnggexw6lv55ty4