Black-sun noise immune correlated double sampling scheme for CMOS image sensors

Je-Hoon Lee, Hyeon-June Kim
2021 IEICE Electronics Express  
This paper presents a black-sun immune correlated double sampling (CDS) scheme for high-quality imaging. Based on an analysis of signal characteristics in strong light conditions, a clamping circuit-based signal difference generator is proposed to accurately present the bright light information. The proposed scheme eliminates the black-sun noise with simple circuitry to improve the A/D conversion efficiency. Moreover, it can be is reversible to the conventional algorithm so that it still
more » ... hat it still preserves the structural advantages of the existing CMOS image sensor (CIS) structure. A prototype CIS with a column-parallel 11-bit single-slope (SS) analogto-digital converter (ADC) was fabricated in a 0.11-µm 1P4M CIS process with a 2.9-µm pixel pitch.
doi:10.1587/elex.18.20210175 fatcat:qqav3cfe7rauvcxxe2ztenzmz4