Study of the Effects of SEU-Induced Faults on a Pipeline Protected Microprocessor

Emmanuel Touloupis, James A. Flint, Member, Vassilios A. Chouliaras, David D. Ward
2007 IEEE transactions on computers  
doi:10.1109/tc.2007.70766 fatcat:yahhg5j54rg2hhru2y2v6wfsu4