A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2020; you can also visit the original URL.
The file type is
The verification of integrated Circuits (ICs) in deep submicron technologies requires that all mutual inductive effects are taken into account to properly validate the performance and reliable operation of the chip. However, the inclusion of all mutual inductive couplings results in a fully dense inductance matrix that renders the circuit simulation computationally prohibitive. In this paper, we present efficient techniques for the solution of the linear systems arising in transient analysis ofdoi:10.1109/iccd46524.2019.00063 dblp:conf/iccd/AntoniadisMESP19 fatcat:6ddu77dkgvfi5dhzwizetifboy