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Application of a Logarithmic Complementary Metal–Oxide–Semiconductor Camera in White-Light Interferometry
IEEE Transactions on Instrumentation and Measurement
This paper describes the characterization, modeling, and application of a direct-readout complementary metal-oxide-semiconductor (CMOS) camera in white-light interferometry (WLI). The camera that was used consisted of a direct-readout 1024 × 1024 pixel logarithmic CMOS sensor. A continuous analog voltage from each pixel was converted to an 8-bit value by an internal analog-to-digital converter and processed with a digital signal processor. A mathematical model relating the input light intensitydoi:10.1109/tim.2007.907962 fatcat:jyhf5ib2rbbzxlfkjkim65fqjm