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This paper presents a test resource partitioning technique based on an efficient single-output response compaction design called quotient compactor (q-Compactor). Some design theorems of quotient compactor are presented to achieve full diagnostics ability, minimize error cancellation and handle the X bits in the outputs of the CUT. The quotient compactor can also be moved to the load-board to reduce the number of ATE channels required. Our experimental results on the ISCAS89 benchmark circuitsdoi:10.1007/s11390-005-0201-3 fatcat:ndh5qj6yt5cj7auhfu6egd37ie