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In-situ UHV-Electron Microscopy with Scanning Tunneling Microscope
2002
Microscopy and Microanalysis
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Ultra-high-vacuum (UHV) electron microscopy has been used for analyses of thin film growths, surface structures, and monolayer adsorbates, in the last two decades. In recent years, a miniaturized scanning tunneling microscope (STM) has been built at the specimen stage of an UHV electron microscope, which allows us to study not only the structures but also electronic states of nanomaterials simultaneously. We present here the construction of an newly developed STM-combined-UHV TEM, and the
doi:10.1017/s1431927602100511
fatcat:wj5zgvno2zhztkospckvw5dhpq