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Sample Surface Degradation of Organic Materials Caused during XPS Analysis
XPS分析における有機材料の試料損傷
2004
Hyomen Kagaku
XPS分析における有機材料の試料損傷
X-ray photoelectron spectroscopy (XPS) is known to be one of the relatively low destructive surface analysis techniques. Surface changes of the samples during the XPS measurements are often observed. This change called surface degradation has at present no standard to determine its extent. In this report, we have carried out several "round-robin" tests to investigate this phenomena, and the relative X-ray dose parameter that represents the intensity of the Ag3d5/2 peak multiplied with the
doi:10.1380/jsssj.25.192
fatcat:hv5x4d4t2fdrrlfjepr4yj54cm