Modular TSC checkers for Bose-Lin and Bose codes

X. Kavousianos, D. Nikolos
Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146)  
doi:10.1109/vtest.1999.766689 dblp:conf/vts/KavousianosN99 fatcat:w52che2akbcidixhefr33updki