An in situ TEM Study of Ferroelastic Domain Mobility

P. Gao, J. Jokisaari, C. Nelson, S.-H. Baek, M. Trassin, C.W. Bark, R. Ramesh, C.-B. Eom, X. Pan
2013 Microscopy and Microanalysis  
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
doi:10.1017/s1431927613009495 fatcat:r73p3lam7rb6vor5atcwcxlsxi