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With the continued advances in miniaturization, bit-line (BL) coupling is becoming ever more influential on the memory behavior. This paper discusses the effects of BL coupling on the faulty behavior of defective dynamic RAMs. It starts with an analytical evaluation of coupling effects, followed by a simulation-based fault analysis using a Spice simulation model. Two BL coupling mechanisms are identified (pre-sense and post-sense coupling), which are found to have a partly opposing effect ondoi:10.1109/tcad.2006.882492 fatcat:dawaexjf7rhcfowgmbhnpns4re