Sampling Quality

1986 IEEE Design & Test of Computers  
This special issue had its genesis in the 22nd Design Automation Conference, held June 23-26, 1985, in Las Vegas. Of the 125 high-quality papers presented at that meeting, seven were eventually selected, updated, and augmented as representative of the areas covered. There are four articles from universities and three from industry covering the areas of layout, silicon compilation with testability, design rule checking and layout analysis, computer-aided manufacturing, and automated schematic
more » ... ry. Many of the articles in this issue emphasize not only design automation, but obtaining solutions to problems that require the human designer to provide the intelligence for producing results superior to those obtained by automation alone. The attempt to incorporate testability features in a silicon compiler is a healthy one. Silicon compilation with the usual metrics of automated synthesis, and without testability considerations, can produce
doi:10.1109/mdt.1986.294912 fatcat:5mv3pc7b6zd2fechgbypropkoq