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This special issue had its genesis in the 22nd Design Automation Conference, held June 23-26, 1985, in Las Vegas. Of the 125 high-quality papers presented at that meeting, seven were eventually selected, updated, and augmented as representative of the areas covered. There are four articles from universities and three from industry covering the areas of layout, silicon compilation with testability, design rule checking and layout analysis, computer-aided manufacturing, and automated schematicdoi:10.1109/mdt.1986.294912 fatcat:5mv3pc7b6zd2fechgbypropkoq