Combined Quantitative Analysis Using both Micro-XRF and EDS Analysis Inside the Scanning Electron Microscope

K.C. Witherspoon, R. Lamb, P. Sjoman, M.D. Hellested
2013 Microscopy and Microanalysis  
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
doi:10.1017/s1431927613008350 fatcat:ab53oblafrb3bpddm55cks4dgy