The increasing presence of power electronic converters in the modern world -from electric vehicles, up to industrial applications -brings up concerns about their reliability, especially in the case of the Wide Band-Gap (WBG) devices. Moreover, ensuring high reliability becomes more challenging due to constantly increasing focus on the development of new types of power supplies in a shorter time. Thus, research over reliability improvement of modern power converters was initiated. In this paper,

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... a concept of Design For Reliability (DfR) procedure, suitable for projects with a short lifespan, and a case study of Power Electronic Building Block (PEBB) designed according to the proposed procedure are presented. Furthermore, a Reliability Oriented Control (ROC) algorithm for WBG-based converters is discussed. INDEX TERMS Semiconductor device reliability, power MOSFETs, reliability engineering. 86488 This work is licensed under a Creative Commons Attribution 4.0 License. For more information, see https://creativecommons.org/licenses/by/4.0/ VOLUME 9, 2021