Gentle and fast atomic force microscopy with a piezoelectric scanning probe for nanorobotics applications

Juan Camilo Acosta, Jérôme Polesel-Maris, François Thoyer, Hui Xie, Sinan Haliyo, Stéphane Régnier
2013 Nanotechnology  
A novel dual tip nanomanipulation atomic force microscope (AFM) platform operating in ambient conditions is presented. The system is equipped with a high frequency quartz piezoelectric self-sensing scanning probe for fast imaging and a passive cantilever for manipulation. The system is validated by imaging and selective pushing/pulling of gold colloid beads (diameters from 80 to 180 nm). This provides a more compact integration compared to an external optical lever and avoids several of its
more » ... backs such as optical interference and noise, and recalibration in the case of a moving cantilever and a fixed laser source and photodiode sensor. Moreover, as the quartz oscillator exhibits oscillation amplitudes in the sub-picometer range with a resonant frequency in the megahertz range, this dynamic force sensor is ideal for fast AFM imaging. Experiments show an increase by five times in imaging speed compared to a classical AFM system.
doi:10.1088/0957-4484/24/6/065502 pmid:23340092 fatcat:qtcbrv7tknf4hot3ka6bo3cdla